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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Effect of thermal annealing on the microstructural properties of Al-doped ZnO thin films grown on n-Si (100) substrates Lee, Jeong Yong; Han, JH; No, YS; Kim, TW; Kim, JY; Choi, WK, 2nd International Conference on Microelectronics and Plasma Technology, 2009-09-22 |
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