Effect of thermal annealing on the microstructural properties of Al-doped ZnO thin films grown on n-Si (100) substrates

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Issue Date
2009-09-22
Language
ENG
Citation

2nd International Conference on Microelectronics and Plasma Technology

URI
http://hdl.handle.net/10203/154870
Appears in Collection
MS-Conference Papers(학술회의논문)
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