Effect of thermal annealing on the microstructural properties of Al-doped ZnO thin films grown on n-Si (100) substrates

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dc.contributor.authorLee, Jeong Yong-
dc.contributor.authorHan, JH-
dc.contributor.authorNo, YS-
dc.contributor.authorKim, TW-
dc.contributor.authorKim, JY-
dc.contributor.authorChoi, WK-
dc.date.accessioned2013-03-19T02:20:45Z-
dc.date.available2013-03-19T02:20:45Z-
dc.date.created2012-02-06-
dc.date.issued2009-09-22-
dc.identifier.citation2nd International Conference on Microelectronics and Plasma Technology, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/154870-
dc.languageENG-
dc.titleEffect of thermal annealing on the microstructural properties of Al-doped ZnO thin films grown on n-Si (100) substrates-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname2nd International Conference on Microelectronics and Plasma Technology-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorLee, Jeong Yong-
dc.contributor.nonIdAuthorHan, JH-
dc.contributor.nonIdAuthorNo, YS-
dc.contributor.nonIdAuthorKim, TW-
dc.contributor.nonIdAuthorKim, JY-
dc.contributor.nonIdAuthorChoi, WK-
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MS-Conference Papers(학술회의논문)
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