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Results 1-10 of 21 (Search time: 0.01 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
Scheduling Algorithms for Minimizing Tardiness of Orders at the Burn-in Workstation in a Semiconductor Manufacturing System

Kim, Yeong-Dae; Kang, Jae-Hun; Lee, Gyeong-Eun; Lim, Seung-Kil, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.24, no.1, pp.14 - 26, 2011-02

2
Modelling and analysis of semiconductor manufacturing in a shrinking world: challenges and successes

Chien, CF; Dauzere-Peres, S; Ehm, H; Fowler, JW; Jiang, ZB; Krishnaswamy, S; Lee, Tae-Eog; Monch, L; Uzsoy, R, EUROPEAN JOURNAL OF INDUSTRIAL ENGINEERING, v.5, no.3, pp.254 - 271, 2011

3
Feedback Control of Cluster Tools for Regulating Wafer Delays

Kim, Chulhan; Lee, Tae-Eog, IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, v.13, no.2, pp.1189 - 1199, 2016-04

4
SECAM: A Supervisory Equipment Control Application Model for Integrated Semiconductor Manufacturing Equipment,

Lee, JH; Lee, Tae-Eog, IEEE ROBOTICS & AUTOMATION MAGAZINE, v.11, no.1, pp.41 - 58, 2004-03

5
Scheduling a wet station for wafer cleaning with multiple job flows and multiple wafer-handling robots

Lee, Tae-Eog; Lee, HY; Lee, SJ, INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, v.45, no.3, pp.487 - 507, 2007-02

6
Virtual control - A virtual cluster tool for testing and verifying a cluster tool controller and a scheduler

Joo, YJ; Lee, Tae-Eog, IEEE ROBOTICS & AUTOMATION MAGAZINE, v.11, no.3, pp.33 - 49, 2004-09

7
Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks

Kyeong, Kiryong; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.31, no.3, pp.395 - 402, 2018-08

8
Detection and clustering of mixed-type defect patterns in wafer bin maps

Kim, Jinho; Lee, Youngmin; Kim, Heeyoung, IISE TRANSACTIONS , v.50, no.2, pp.99 - 111, 2018-01

9
Wafer delay analysis and control of dual-armed cluster tools with chamber cleaning operations

Yu, Tae-Sun; Lee, Tae-Eog, INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, v.58, no.2, pp.434 - 447, 2020-01

10
Scheduling Single-Armed Cluster Tools With Chamber Cleaning Operations

Yu, Tae Sun; Kim, Hyunjung; Lee, Tae-Eog, IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, v.15, no.2, pp.705 - 716, 2018-04

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