Results 1-10 of 21 (Search time: 0.01 seconds).
NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Scheduling Algorithms for Minimizing Tardiness of Orders at the Burn-in Workstation in a Semiconductor Manufacturing System Kim, Yeong-Dae; Kang, Jae-Hun; Lee, Gyeong-Eun; Lim, Seung-Kil, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.24, no.1, pp.14 - 26, 2011-02 | |
Modelling and analysis of semiconductor manufacturing in a shrinking world: challenges and successes Chien, CF; Dauzere-Peres, S; Ehm, H; Fowler, JW; Jiang, ZB; Krishnaswamy, S; Lee, Tae-Eog; Monch, L; Uzsoy, R, EUROPEAN JOURNAL OF INDUSTRIAL ENGINEERING, v.5, no.3, pp.254 - 271, 2011 | |
Feedback Control of Cluster Tools for Regulating Wafer Delays Kim, Chulhan; Lee, Tae-Eog, IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, v.13, no.2, pp.1189 - 1199, 2016-04 | |
SECAM: A Supervisory Equipment Control Application Model for Integrated Semiconductor Manufacturing Equipment, Lee, JH; Lee, Tae-Eog, IEEE ROBOTICS & AUTOMATION MAGAZINE, v.11, no.1, pp.41 - 58, 2004-03 | |
Scheduling a wet station for wafer cleaning with multiple job flows and multiple wafer-handling robots Lee, Tae-Eog; Lee, HY; Lee, SJ, INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, v.45, no.3, pp.487 - 507, 2007-02 | |
Virtual control - A virtual cluster tool for testing and verifying a cluster tool controller and a scheduler Joo, YJ; Lee, Tae-Eog, IEEE ROBOTICS & AUTOMATION MAGAZINE, v.11, no.3, pp.33 - 49, 2004-09 | |
Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks Kyeong, Kiryong; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.31, no.3, pp.395 - 402, 2018-08 | |
Detection and clustering of mixed-type defect patterns in wafer bin maps Kim, Jinho; Lee, Youngmin; Kim, Heeyoung, IISE TRANSACTIONS , v.50, no.2, pp.99 - 111, 2018-01 | |
Wafer delay analysis and control of dual-armed cluster tools with chamber cleaning operations Yu, Tae-Sun; Lee, Tae-Eog, INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, v.58, no.2, pp.434 - 447, 2020-01 | |
Scheduling Single-Armed Cluster Tools With Chamber Cleaning Operations Yu, Tae Sun; Kim, Hyunjung; Lee, Tae-Eog, IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, v.15, no.2, pp.705 - 716, 2018-04 |
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