Showing results 1 to 5 of 5
A Bayesian nonparametric mixture measurement error model with application to spatial density estimation using mobile positioning data with multi-accuracy and multi-coverage Lee, Youngmin; Jeong, Taewon; Kim, Heeyoung, TECHNOMETRICS, v.62, no.2, pp.173 - 183, 2020-04 |
Bayesian Nonparametric Joint Mixture Model for Clustering Spatially Correlated Time Series Lee, Youngmin; Kim, Heeyoung, TECHNOMETRICS, v.62, no.3, pp.313 - 329, 2020-07 |
Bayesian nonparametric latent class model for longitudinal data Koo, Wonmo; Kim, Heeyoung, STATISTICAL METHODS IN MEDICAL RESEARCH, v.29, no.11, pp.3381 - 3395, 2020-11 |
Detection and clustering of mixed-type defect patterns in wafer bin maps Kim, Jinho; Lee, Youngmin; Kim, Heeyoung, IISE TRANSACTIONS , v.50, no.2, pp.99 - 111, 2018-01 |
Variational Deep Clustering of Wafer Map Patterns Hwang, Jonghyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.3, pp.466 - 475, 2020-08 |
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