Browse "IE-Journal Papers(저널논문)" by Author HAMMER, JM

Showing results 2 to 2 of 2

2
DEEP-REASONING FAULT-DIAGNOSIS - AN AID AND A MODEL

Yoon, Wan Chul; HAMMER, JM, IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS, v.18, no.4, pp.659 - 676, 1988-07

Discover

Type

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0