Electrical Characteristics and Thermally Induced Metastability in an Amorphous silicon Ambipolar Transistor

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Publisher
IEEE-Inst Electrical Electronics Engineers Inc
Issue Date
1989-12
Language
English
Article Type
Article; Proceedings Paper
Citation

IEEE TRANSACTIONS ON ELECTRON DEVICES, v.36, no.12, pp.2928 - 2934

ISSN
0018-9383
URI
http://hdl.handle.net/10203/59716
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