OPTIMAL NUMBER OF MAJOR FAILURES BEFORE REPLACEMENT
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Kyung Soo | ko |
| dc.date.accessioned | 2013-02-24T14:36:32Z | - |
| dc.date.available | 2013-02-24T14:36:32Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1985 | - |
| dc.identifier.citation | MICROELECTRONICS AND RELIABILITY, v.25, no.4, pp.797 - 805 | - |
| dc.identifier.issn | 0026-2714 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/57911 | - |
| dc.language | English | - |
| dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
| dc.title | OPTIMAL NUMBER OF MAJOR FAILURES BEFORE REPLACEMENT | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1985AST5300028 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 25 | - |
| dc.citation.issue | 4 | - |
| dc.citation.beginningpage | 797 | - |
| dc.citation.endingpage | 805 | - |
| dc.citation.publicationname | MICROELECTRONICS AND RELIABILITY | - |
| dc.identifier.doi | 10.1016/0026-2714(85)90413-5 | - |
| dc.contributor.localauthor | Park, Kyung Soo | - |
| dc.type.journalArticle | Article | - |
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