Optimum Software Release Policy with Random Life Cycle
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | w.y. yun | ko |
| dc.contributor.author | Bai, Do Sun | ko |
| dc.date.accessioned | 2013-02-24T14:30:30Z | - |
| dc.date.available | 2013-02-24T14:30:30Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1990 | - |
| dc.identifier.citation | IEEE TRANSACTIONS ON RELIABILITY, v.39, no.2, pp.167 - 170 | - |
| dc.identifier.issn | 0018-9529 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/57873 | - |
| dc.language | English | - |
| dc.publisher | IEEE-Inst Electrical Electronics Engineers Inc | - |
| dc.title | Optimum Software Release Policy with Random Life Cycle | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1990DF06700013 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 39 | - |
| dc.citation.issue | 2 | - |
| dc.citation.beginningpage | 167 | - |
| dc.citation.endingpage | 170 | - |
| dc.citation.publicationname | IEEE TRANSACTIONS ON RELIABILITY | - |
| dc.identifier.doi | 10.1109/24.55877 | - |
| dc.contributor.nonIdAuthor | w.y. yun | - |
| dc.type.journalArticle | Article | - |
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