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Optimum Simple Step-Stress Accelerated Life Tests with Censoring

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Bai, Do Sun / m.s. kim / s.h. lee
Publisher
IEEE-Inst Electrical Electronics Engineers Inc
Issue Date
1989-12
Language
English
Article Type
Article
Citation

IEEE TRANSACTIONS ON RELIABILITY, v.38, no.5, pp.528 - 532

ISSN
0018-9529
URI
http://hdl.handle.net/10203/57870
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