Optimum Simple Step-Stress Accelerated Life Tests with Censoring
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Bai, Do Sun | ko |
| dc.contributor.author | m.s. kim | ko |
| dc.contributor.author | s.h. lee | ko |
| dc.date.accessioned | 2013-02-24T14:30:02Z | - |
| dc.date.available | 2013-02-24T14:30:02Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1989-12 | - |
| dc.identifier.citation | IEEE TRANSACTIONS ON RELIABILITY, v.38, no.5, pp.528 - 532 | - |
| dc.identifier.issn | 0018-9529 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/57870 | - |
| dc.language | English | - |
| dc.publisher | IEEE-Inst Electrical Electronics Engineers Inc | - |
| dc.title | Optimum Simple Step-Stress Accelerated Life Tests with Censoring | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1989CP83500008 | - |
| dc.identifier.scopusid | 2-s2.0-0024891878 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 38 | - |
| dc.citation.issue | 5 | - |
| dc.citation.beginningpage | 528 | - |
| dc.citation.endingpage | 532 | - |
| dc.citation.publicationname | IEEE TRANSACTIONS ON RELIABILITY | - |
| dc.contributor.nonIdAuthor | m.s. kim | - |
| dc.contributor.nonIdAuthor | s.h. lee | - |
| dc.type.journalArticle | Article | - |
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