CHARGE EMISSION AND PRECURSOR ACCUMULATION IN THE MULTIPLE-PULSE DAMAGE REGIME OF SILICON
- Publisher
- OPTICAL SOC AMER
- Issue Date
- 1985
- Language
- English
- Article Type
- Article
- Citation
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, v.2, no.10, pp.1626 - 1633
- ISSN
- 0740-3224
- Appears in Collection
- RIMS Journal Papers
- Files in This Item
- There are no files associated with this item.
This item is cited by other documents in WoS
| ⊙ Detail Information in WoSⓡ | Click to see |  |
| ⊙ Cited 23 items in WoS | Click to see citing articles in |  |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.