DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jhee, Youn Kyu | ko |
dc.contributor.author | BECKER, MF | ko |
dc.contributor.author | WALSER, RM | ko |
dc.date.accessioned | 2013-02-24T14:23:47Z | - |
dc.date.available | 2013-02-24T14:23:47Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1985 | - |
dc.identifier.citation | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, v.2, no.10, pp.1626 - 1633 | - |
dc.identifier.issn | 0740-3224 | - |
dc.identifier.uri | http://hdl.handle.net/10203/57832 | - |
dc.language | English | - |
dc.publisher | OPTICAL SOC AMER | - |
dc.title | CHARGE EMISSION AND PRECURSOR ACCUMULATION IN THE MULTIPLE-PULSE DAMAGE REGIME OF SILICON | - |
dc.type | Article | - |
dc.identifier.wosid | A1985ASB2700005 | - |
dc.type.rims | ART | - |
dc.citation.volume | 2 | - |
dc.citation.issue | 10 | - |
dc.citation.beginningpage | 1626 | - |
dc.citation.endingpage | 1633 | - |
dc.citation.publicationname | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS | - |
dc.contributor.localauthor | Jhee, Youn Kyu | - |
dc.contributor.nonIdAuthor | BECKER, MF | - |
dc.contributor.nonIdAuthor | WALSER, RM | - |
dc.type.journalArticle | Article | - |
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