DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Kyung Soo | ko |
dc.date.accessioned | 2013-02-24T12:59:05Z | - |
dc.date.available | 2013-02-24T12:59:05Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1985-12 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON RELIABILITY, v.34, no.5, pp.519 - 521 | - |
dc.identifier.issn | 0018-9529 | - |
dc.identifier.uri | http://hdl.handle.net/10203/57318 | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | OPTIMAL USE OF PRODUCT WARRANTIES | - |
dc.type | Article | - |
dc.identifier.wosid | A1985AXB7400027 | - |
dc.type.rims | ART | - |
dc.citation.volume | 34 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 519 | - |
dc.citation.endingpage | 521 | - |
dc.citation.publicationname | IEEE TRANSACTIONS ON RELIABILITY | - |
dc.contributor.localauthor | Park, Kyung Soo | - |
dc.type.journalArticle | Article | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.