Search
Results 1-6 of 6 (Search time: 0.005 seconds).
| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Hybrid Gate Dielectric of MoS2 Transistors for Enhanced Photo-Electronic Stability Park, Hamin; Oh, Dong Sik; Hong, Woonggi; Kang, Juyeon; Lee, Geon-Beom; Shin, Gwang Hyuk; Choi, Yang-Kyu; Im, Sung Gap; Choi, Sung-Yool, ADVANCED MATERIALS INTERFACES, v.8, no.14, pp.2100599, 2021-07 | |
| Multi-functional logic circuits composed of ultra-thin electrolyte-gated transistors with wafer-scale integration Yu, Ji-Man; Lee, Chungryeol; Han, Joon-Kyu; Han, Seong-Joo; Lee, Geon-Beom; Im, Sung Gap; Choi, Yang-Kyu, JOURNAL OF MATERIALS CHEMISTRY C, v.9, no.22, pp.7222 - 7227, 2021-06 | |
| A Temperature Sensor With a Thermillator Lee, Mun-Woo; Han, Joon-Kyu; Yun, Gyeong-Jun; Yu, Ji-Man; Lee, Geon-Beom; Han, Seong-Joo; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.42, no.11, pp.1654 - 1657, 2021-09 | |
Ternary logic decoder using independently controlled double-gate Si-NW MOSFETs Han, Seong-Joo; Han, Joon-kyu; Kim, Myung-Su; Yun, Gyeong-Jun; Yu, Ji-Man; Tcho, Il-Woong; Seo, Myungsoo; Lee, Geon-Beom; Choi, Yang-Kyu, SCIENTIFIC REPORTS, v.11, no.1, pp.13018, 2021-06 | |
| Lateral profiling of gate dielectric damage by off-state stress and positive-bias temperature instability Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Choi, Yang-Kyu, MICROELECTRONICS AND RELIABILITY, v.127, pp.114383, 2021-12 | |
| Improved Self-Curing Effect in a MOSFET with Gate Biasing Lee, Geon-Beom; Jung, Jin-Woo; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.42, no.12, pp.1731 - 1734, 2021-12 |
Discover