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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Low-Frequency Noise Characteristics Under the OFF-State Stress Lee, Geon-Beom; Kim, Choong-Ki; Yoo, Min-Soo; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.10, pp.4366 - 4371, 2020-10 |
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