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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Electrothermal Annealing (ETA) Method to Enhance the Electrical Performance of Amorphous-Oxide-Semiconductor (AOS) Thin-Film Transistors (TFTs) Kim, Choong-Ki; Kim, Eungtaek; Lee, Myung Keun; Park, Jun-Young; Seol, Myeong-Lok; Bae, Hagyoul; Bang, Tewook; Jeon, Seung-Bae; Jun, Sungwoo; Park, Sang-Hee Ko; Choi, Kyung Cheol; Choi, Yang-Kyu, ACS APPLIED MATERIALS & INTERFACES, v.8, no.36, pp.23820 - 23826, 2016-09 | |
Logic circuits composed of flexible carbon nanotube thin-film transistor and ultra-thin polymer gate dielectric Lee, Dongil; Yoon, Jinsu; Lee, Juhee; Lee, Byung-Hyun; Seol, Myeong-Lok; Bae, Hagyoul; Jeon, Seung-Bae; Seong, Hyejeong; Im, Sung Gap; Choi, Sung-Jin; Choi, Yang-Kyu, SCIENTIFIC REPORTS, v.6, 2016-05 | |
| Ink-jet printed semiconducting carbon nanotube ambipolar transistors and inverters with chemical doping technique using polyethyleneimine Lee, Juhee; Yoon, Jinsu; Choi, Bongsik; Lee, Dongil; Kim, Dong Myong; Kim, Dae Hwan; Choi, Yang-Kyu; Choi, Sung-Jin, APPLIED PHYSICS LETTERS, v.109, no.26, 2016-12 | |
| Single Walled Carbon Nanotube-Based Electrical Biosensor for the Label-Free Detection of Pathogenic Bacteria Yoo, Seung Min; Baek, Youn-Kyoung; Shin, Sun Hae Ra; Kim, Ju-Hyun; Jung, Hee-Tae; Choi, Yang-Kyu; Lee, Sang Yup, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.16, no.6, pp.6520 - 6525, 2016-06 | |
| Influence of the charge trap density distribution in a gate insulator on the positive-bias stress instability of amorphous indium-gallium-zinc oxide thin-film transistors Kim, Eungtaek; Kim, Choong-Ki; Lee, Myung Keun; Bang, Tewook; Choi, Yang-Kyu; Park, Sang-Hee Ko; Choi, Kyung Cheol, APPLIED PHYSICS LETTERS, v.108, no.18, 2016-05 | |
| A Vertically Integrated Junctionless Nanowire Transistor Lee, Byung-Hyun; Hur, Jae; Kang, Min-Ho; Bang, Tewook; Ahn, Dae-Chul; Lee, Dongil; Kim, Kwang-Hee; Choi, Yang-Kyu, NANO LETTERS, v.16, no.3, pp.1840 - 1847, 2016-03 | |
| Self-Curable Gate-All-Around MOSFETs Using Electrical Annealing to Repair Degradation Induced From Hot-Carrier Injection Park, Jun-Young; Moon, Dong-Il; Seol, Myeong-Lok; Kim, Choong-Ki; Jeon, Chang-Hoon; Bae, Hagyoul; Bang, Tewook; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.3, pp.910 - 915, 2016-03 | |
| Triboelectric Nanogenerator Based on the Internal Motion of Powder with a Package Structure Design Kim, Daewon; Oh, Yura; Hwang, Byeong Woon; Jeon, Seung-Bae; Park, Sang-Jae; Choi, Yang-Kyu, ACS NANO, v.10, no.1, pp.1017 - 1024, 2016-01 | |
| Ultra-Fast Erase Method of SONOS Flash Memory by Instantaneous Thermal Excitation Ahn, Dae-Chul; Seol, Myeong-Lok; Hur, Jae; Moon, Dong-Il; Lee, Byung-Hyun; Han, Jin-Woo; Park, Jun-Young; Jeon, Seung-Bae; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.37, no.2, pp.190 - 192, 2016-02 | |
| Controllable electrical and physical breakdown of poly-crystalline silicon nanowires by thermally assisted electromigration Park, Jun-Young; Moon, Dong-Il; Seol, Myeong-Lok; Jeon, Chang-Hoon; Jeon, Gwang-Jae; Han, Jin-Woo; Kim, Choong-Ki; Park, Sang-Jae; Lee, Hee Chul; Choi, Yang-Kyu, SCIENTIFIC REPORTS, v.6, 2016-01 |
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