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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Investigation of Low-Frequency Noise in Nonvolatile Memory Composed of a Gate-All-Around Junctionless Nanowire FET Jeong, Ui-Sik; Kim, Choong-Ki; Bae, Hagyoul; Moon, Dong-Il; Bang, Tewook; Choi, Ji-Min; Hur, Jae; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.5, pp.2210 - 2213, 2016-05 | |
| Electrothermal Annealing (ETA) Method to Enhance the Electrical Performance of Amorphous-Oxide-Semiconductor (AOS) Thin-Film Transistors (TFTs) Kim, Choong-Ki; Kim, Eungtaek; Lee, Myung Keun; Park, Jun-Young; Seol, Myeong-Lok; Bae, Hagyoul; Bang, Tewook; Jeon, Seung-Bae; Jun, Sungwoo; Park, Sang-Hee Ko; Choi, Kyung Cheol; Choi, Yang-Kyu, ACS APPLIED MATERIALS & INTERFACES, v.8, no.36, pp.23820 - 23826, 2016-09 | |
Logic circuits composed of flexible carbon nanotube thin-film transistor and ultra-thin polymer gate dielectric Lee, Dongil; Yoon, Jinsu; Lee, Juhee; Lee, Byung-Hyun; Seol, Myeong-Lok; Bae, Hagyoul; Jeon, Seung-Bae; Seong, Hyejeong; Im, Sung Gap; Choi, Sung-Jin; Choi, Yang-Kyu, SCIENTIFIC REPORTS, v.6, 2016-05 | |
| Self-Curable Gate-All-Around MOSFETs Using Electrical Annealing to Repair Degradation Induced From Hot-Carrier Injection Park, Jun-Young; Moon, Dong-Il; Seol, Myeong-Lok; Kim, Choong-Ki; Jeon, Chang-Hoon; Bae, Hagyoul; Bang, Tewook; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.3, pp.910 - 915, 2016-03 | |
| Local Electro-Thermal Annealing for Repair of Total Ionizing Dose-Induced Damage in Gate-All-Around MOSFETs Park, Jun-Young; Moon, Dong-Il; Bae, Hagyoul; Roh, Young Tak; Seol, Myeong-Lok; Lee, Byung-Hyun; Jeon, Chang-Hoon; Lee, Hee Chul; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.37, no.7, pp.843 - 846, 2016-07 | |
| Joule Heating to Enhance the Performance of a Gate-All-Around Silicon Nanowire Transistor Jeon, Chang-Hoon; Park, Jun-Young; Seol, Myeong-Lok; Moon, Dong-Il; Hur, Jae; Bae, Hagyoul; Jeon, Seung-Bae; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.6, pp.2288 - 2292, 2016-06 | |
| Abnormal electrical characteristics of multi-layered MoS2 FETs attributed to bulk traps Kim, Choong-Ki; Yu, Chan Hak; Hur, Jae; Bae, Hagyoul; Jeon, Seung-Bae; Park, Hamin; Kim, Yong Min; Choi, Kyung Cheol; Choi, Yang-Kyu; Choi, Sung Yool, 2D MATERIALS, v.3, no.1, pp.015007, 2016-03 | |
| A Separate Extraction Method for Asymmetric Source and Drain Resistances Using Frequency-Dispersive C-V Characteristics in Exfoliated MoS2 FET Bae, Hagyoul; Kim, Choong-Ki; Jeon, Seung-Bae; Shin, Gwang Hyuk; Kim, Eung Taek; Song, Jeong-Gyu; Kim, Youngjun; Lee, Dong-Il; Kim, Hyungjun; Choi, Sung-Yool; Choi, Kyung Cheol; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.37, no.2, pp.231 - 233, 2016-02 | |
| Physically Transient Memory on a Rapidly Dissoluble Paper for Security Application Bae, Hagyoul; Lee, Byung-Hyun; Lee, Dongil; Seol, Myeong-Lok; Kim, Daewon; Han, Jin-Woo; Kim, Choong-Ki; Jeon, Seung-Bae; Ahn, Daechul; Park, Sang-Jae; Park, Jun-Young; Choi, Yang-Kyu, SCIENTIFIC REPORTS, v.6, 2016-12 | |
| Threshold Voltage Tuning Technique in Gate-All-Around MOSFETs by Utilizing Gate Electrode With Potential Distribution Park, Jun-Young; Bae, Hagyoul; Moon, Dong-Il; Jeon, Chang-Hoon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.37, no.11, pp.1391 - 1394, 2016-11 |
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