Browse "EE-Journal Papers(저널논문)" by Subject endurance
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| Cryogenic Storage Memory with High-Speed, Low-Power, and Long-Retention Performance Hur, Jae; Kang, Dongsuk; Moon, Dong-Il; Yu, Jiman; Choi, Yang-Kyu; Shimeng, Yu, ADVANCED ELECTRONIC MATERIALS, v.9, no.6, 2023-06 |
| Mechanically Operated Random Access Memory (MORAM) Based on an Electrostatic Microswitch for Nonvolatile Memory Applications Jang, Weon-Wi; Lee, Jeong-Oen; Yang, Hyun-Ho; Yoon, Jun-Bo, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.55, no.10, pp.2785 - 2789, 2008-10 |
| Optimization of Bias Schemes for Long-Term Endurable 1T-DRAM Through the Use of the Biristor Mode Operation Kim, Dong-Oh; Moon, Dong-Il; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.35, no.2, pp.220 - 222, 2014-02 |
| Power-Delay Area-Efficient Processing-In-Memory Based on Nanocrystalline Hafnia Ferroelectric Field-Effect Transistors Kim, Giuk; Ko, Dong Han; Kim, Taeho; Lee, Sangho; Jung, Minhyun; Lee, Young Kyu; Lim, Sehee; et al, ACS APPLIED MATERIALS & INTERFACES, v.15, no.1, pp.1463 - 1474, 2023-01 |
| Reliability Improvement of Gate-All-Around Junctionless SONOS Memory by Joule Heat From Inherent Nanowire Current Lee, Jung-Woo; Han, Joon-Kyu; Kim, Myung-Su; Yu, Ji-Man; Jung, Jin-Woo; Yun, Seong-Yun; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.11, pp.6133 - 6138, 2022-11 |
| Reliability Improvement of Gate-All-Around SONOS Memory by Joule Heat From Gate-Induced Drain Leakage Current Lee, Jung-Woo; Han, Joon-Kyu; Yu, Ji-Man; Lee, Geon-Beom; Tcho, Il-Woong; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.1, pp.115 - 119, 2022-01 |
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