Showing results 1 to 5 of 5
A simple method for high-frequency characterization of (Ba,Sr)TiO3 thin film capacitors Jang, BT; Kwak, DH; Cha, SY; Lee, SH; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.20, no.1-4, pp.215 - 224, 1998 |
Deoxidization of iridium oxide thin film Cha, SY; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.38, no.10A, pp.1128 - 1130, 1999-10 |
Effects of Ir electrodes on the dielectric constants of Ba0.5Sr0.5TiO3 films Cha, SY; Jang, BT; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.38, no.1AB, pp.49 - 51, 1999-01 |
Influence of TiO2 adhesion layer thickness on properties of (Ba,Sr)TiO3 thin films Kim, YJ; Lee, YS; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.44, pp.6167 - 6169, 2005-08 |
Reliability of High Dielectric Ba0.5Sr0.5TiO3 Capacitors Using Iridium Electrode Lee, Hee Chul; S.Y.Cha; B.T.Jang, INTEGRATED FERROELECTRICS, v.24, no.1-4, pp.45 - 55, 1999-01 |
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