Browse "EE-Journal Papers(저널논문)" by Title
Showing results 7701 to 7720 of 14186
| Liquid gate dielectric field effect transistor for a radiation nose Han, Jin-Woo; Meyyappan, M.; Ahn, Jae-Hyuk; Choi, Yang-Kyu, SENSORS AND ACTUATORS A-PHYSICAL, v.182, pp.1 - 5, 2012-08 |
| Liquid-based electrostatic energy harvester with high sensitivity to human physical motion Choi, Dong-Hoon; Han, Chang-Hoon; Kim, Hyun-Don; Yoon, Jun-Bo, SMART MATERIALS STRUCTURES, v.20, no.12, 2011-12 |
| Liquid-Crystal Waveguides for Integrated Optics Whinnery, J. R.; Hu, Chenming; Kwon, Young Se, IEEE JOURNAL OF QUANTUM ELECTRONICS, v.13, no.4, pp.262 - 267, 1977-04 |
| Lithium niobate integrated-optic voltage sensor with variable sensing ranges Yim, YS; Shin, Sang Yung, OPTICS COMMUNICATIONS, v.152, no.4-6, pp.225 - 228, 1998-07 |
| LITHIUM-NIOBATE RIDGE WAVE-GUIDES FABRICATED BY WET ETCHING LEE, HJ; Shin, Sang Yung, ELECTRONICS LETTERS, v.31, no.4, pp.268 - 269, 1995-02 |
| LITHOGRAPHIC PERFORMANCE ENHANCEMENT USING DUMMY DIFFRACTION MASK Yoo, Hyung Joun; OH, YH; PARK, BS; CHOI, SS; JEON, YJ; LEE, C; Park, Sin Chong, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.32, no.12B, pp.5903 - 5908, 1993-12 |
| Lithography Defect Probability and Its Application to Physical Design Optimization Shim, Seongbo; Chung, Woohyun; Shin, Youngsoo, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.25, no.1, pp.271 - 285, 2017-01 |
| LLC Resonant Converter With Adaptive Link-Voltage Variation for a High-Power-Density Adapter Kim, Bong-Chul; Park, Ki-Bum; Kim, Chong-Eun; Lee, Byoung-Hee; Moon, Gun-Woo, IEEE TRANSACTIONS ON POWER ELECTRONICS, v.25, pp.2248 - 2252, 2010-09 |
| LMI-based robust sampled-data stabilization of polytopic LTI systems: A truncated power series expansion approach Lee, Doug Hwan; Joo, Young Loon, INTERNATIONAL JOURNAL OF CONTROL AUTOMATION AND SYSTEMS, v.13, no.2, pp.284 - 291, 2015-04 |
| LMMSE Channel Estimation with Soft Statistics for Turbo-MIMO Receivers Shin, Wooram; Lee, Seung Joon; Kwon, Dong-Seung; Kang, Joonhyuk, IEEE COMMUNICATIONS LETTERS, v.13, no.8, pp.585 - 587, 2009-08 |
| LMS 기반 적응 등화기에서 빠른 수렴을 위한 기준신호 변형 이기현; 최진호; 박래홍; 송익호; 박재혁; 이병욱, 한국통신학회논문지, v.19, no.5, pp.939 - 951, 1994-04 |
| Load Adaptive Gate Driving Method for High Efficiency Under Light-Load Conditions Kim, Jae Hyun; Kim, Jae-Kuk; Lee, Jae-Bum; Moon, GunWoo, IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, v.61, no.9, pp.4674 - 4679, 2014-09 |
Load Profile Extraction by Mean-Shift Clustering with Sample Pearson Correlation Coefficient Distance Kim, Nakyoung; Park, Sangdon; Lee, Joohyung; Choi, Jun Kyun, ENERGIES, v.11, no.9, 2018-09 |
| Load-Balance-Independent High Efficiency Single-Inductor Multiple-Output (SIMO) DC-DC Converters Ko, Younghun; Jang, Yeongshin; Han, Sok-Kyun; Lee, Sang-Gug, JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.14, no.3, pp.300 - 312, 2014-06 |
| Load-Independent Control of Switching DC-DC Converters With Freewheeling Current Feedback Woo, Youn-Jin; Le, Hanh-Phuc; Cho, Gyu-Ha; Cho, Gyu-Hyeong; Kim, Seong-Il, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.43, pp.2798 - 2808, 2008-12 |
| Loading Assistant Robot System Type III for the Handicapped in Real Manufacturing Environment Choi, Seung-Won; Cho, Yong-Ho; Park, Sang-Uk; Park, Dong-Jo; Kim Joon-Tae, INTERNATIONAL JOURNAL OF ASSISTIVE ROBOTICS AND MECHATRONICS, v.8, no.3, pp.19 - 25, 2007-09 |
| Local Alignment of DNA Sequence Based on Deep Reinforcement Learning Song, YongJoon; Cho, Dong-Ho, IEEE OPEN JOURNAL OF ENGINEERING IN MEDICINE AND BIOLOGY, v.2, pp.170 - 178, 2021-06 |
| Local Color Vector Binary Patterns From Multichannel Face Images for Face Recognition Lee, Seung-Ho; Choi, Jae-Young; Ro, Yong-Man; Plataniotis, Konstantinos N., IEEE TRANSACTIONS ON IMAGE PROCESSING, v.21, no.4, pp.2347 - 2353, 2012-04 |
| Local deformation calibration for autostereoscopic 3D display Hwang, Hyoseok; Chang, Hyun Sung; Kweon, In So, OPTICS EXPRESS, v.25, no.10, pp.10801 - 10814, 2017-05 |
| Local Electro-Thermal Annealing for Repair of Total Ionizing Dose-Induced Damage in Gate-All-Around MOSFETs Park, Jun-Young; Moon, Dong-Il; Bae, Hagyoul; Roh, Young Tak; Seol, Myeong-Lok; Lee, Byung-Hyun; Jeon, Chang-Hoon; et al, IEEE ELECTRON DEVICE LETTERS, v.37, no.7, pp.843 - 846, 2016-07 |
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