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Scalable in-memory clustered annealer with temporal noise of FinFET for the travelling salesman problem

Lu, Anni; Choi, Yang-Kyu; Hur, Jae; Luo, Yuan-Chun; Li, Hai; Nikonov, Dmitri; Young, Ian; et al, 68th IEEE International Electron Devices Meeting, IEDM 2022, IEEE, 2022-12-03

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