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Scalable in-memory clustered annealer with temporal noise of FinFET for the travelling salesman problem

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Lu, Anni / Choi, Yang-Kyuresearcher / Hur, Jae / Luo, Yuan-Chun / Li, Hai / Nikonov, Dmitri / Young, Ian / Yu, Shimeng
Publisher
IEEE
Issue Date
2022-12-03
Language
English
Citation

68th IEEE International Electron Devices Meeting, IEDM 2022

URI
http://hdl.handle.net/10203/300924
Appears in Collection
EE-Conference Papers(학술회의논문)
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