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Microstructural characterization of heterointerfaces in MOCVD grown InGaAs/GaAs strained-layer system using cross section transmission electron micros

Park, M. C.; Park, HyoHoon; Kwon, O. J., Inst. Phys. the Royal Microscopical Society Conference: Microscopy of Semiconducting Materials 1993, pp.481 - 484, 1993-04-05

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