Browse "EE-Conference Papers(학술회의논문)" by Author N. Balasubramanian, N
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| A novel approach for integration of dual metal gate process using ultra thin aluminum nitride buffer layer Cho, Byung Jin; Park, CS; N. Balasubramanian, N; Kwong, DL, Symposium on VLSI Technology, pp.149 - 149, 2003-06-10 |
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