전자 패키지에서 다층 구조의 기계적인 신뢰성에 관한 연구A study on mechanical reliability of multi- layered structure in electronic packages

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dc.contributor.advisor엄윤용-
dc.contributor.advisorEarmme, Youn-Young-
dc.contributor.author김재현-
dc.contributor.authorKim, Jae-Hyun-
dc.date.accessioned2011-12-14T05:20:03Z-
dc.date.available2011-12-14T05:20:03Z-
dc.date.issued2002-
dc.identifier.urihttp://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=177247&flag=dissertation-
dc.identifier.urihttp://hdl.handle.net/10203/43146-
dc.description학위논문(박사) - 한국과학기술원 : 기계공학전공, 2002.8, [ x, 107 p. ]-
dc.languagekor-
dc.publisher한국과학기술원-
dc.subject계면파괴역학-
dc.subject신뢰성-
dc.subject다층 구조-
dc.subject전자 패키지-
dc.subject열응력-
dc.subjectthermal stress-
dc.subjectinterfacial fracture mechanics-
dc.subjectreliability-
dc.subjectmulti-layered structure-
dc.subjectelectronic packages-
dc.title전자 패키지에서 다층 구조의 기계적인 신뢰성에 관한 연구-
dc.title.alternativeA study on mechanical reliability of multi- layered structure in electronic packages-
dc.typeThesis(Ph.D)-
dc.identifier.CNRN177247/325007-
dc.description.department한국과학기술원 : 기계공학전공, -
dc.identifier.uid000965096-
dc.contributor.localauthor엄윤용-
dc.contributor.localauthorEarmme, Youn-Young-
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ME-Theses_Ph.D.(박사논문)
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