수리횟수 및 불량 주변 칩 수를 고려한 결함내성 메모리 반도체의 번인정책에 관한 연구Development of burn-in policies for defect tolerant memory products considering the number of repairs and defective neighborhood chips
- Advisors
- 염봉진researcher; Yum, Bong-Jinresearcher
- Description
- 한국과학기술원 : 산업공학과,
- Publisher
- 한국과학기술원
- Issue Date
- 2006
- Identifier
- 254264/325007 / 020025102
- Language
- kor
- Description
학위논문(박사) - 한국과학기술원 : 산업공학과, 2006.2, [ ix, 106 p. ]
- Keywords
비용 모형; 비례고장률 모형; 결함내성 메모리; 번인; 결함의 군집; defect clustering; cost model; proportional hazard model; defect-tolerant memory; burn-in
- Appears in Collection
- IE-Theses_Ph.D.(박사논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.