수리횟수 및 불량 주변 칩 수를 고려한 결함내성 메모리 반도체의 번인정책에 관한 연구Development of burn-in policies for defect tolerant memory products considering the number of repairs and defective neighborhood chips
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 염봉진 | - |
| dc.contributor.advisor | Yum, Bong-Jin | - |
| dc.contributor.author | 동승훈 | - |
| dc.contributor.author | Tong, Seung-Hoon | - |
| dc.date.accessioned | 2011-12-14T02:40:20Z | - |
| dc.date.available | 2011-12-14T02:40:20Z | - |
| dc.date.issued | 2006 | - |
| dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=254264&flag=dissertation | - |
| dc.identifier.uri | http://hdl.handle.net/10203/40586 | - |
| dc.description | 학위논문(박사) - 한국과학기술원 : 산업공학과, 2006.2, [ ix, 106 p. ] | - |
| dc.language | kor | - |
| dc.publisher | 한국과학기술원 | - |
| dc.subject | 비용 모형 | - |
| dc.subject | 비례고장률 모형 | - |
| dc.subject | 결함내성 메모리 | - |
| dc.subject | 번인 | - |
| dc.subject | 결함의 군집 | - |
| dc.subject | defect clustering | - |
| dc.subject | cost model | - |
| dc.subject | proportional hazard model | - |
| dc.subject | defect-tolerant memory | - |
| dc.subject | burn-in | - |
| dc.title | 수리횟수 및 불량 주변 칩 수를 고려한 결함내성 메모리 반도체의 번인정책에 관한 연구 | - |
| dc.title.alternative | Development of burn-in policies for defect tolerant memory products considering the number of repairs and defective neighborhood chips | - |
| dc.type | Thesis(Ph.D) | - |
| dc.identifier.CNRN | 254264/325007 | - |
| dc.description.department | 한국과학기술원 : 산업공학과, | - |
| dc.identifier.uid | 020025102 | - |
| dc.contributor.localauthor | 염봉진 | - |
| dc.contributor.localauthor | Yum, Bong-Jin | - |
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