On-chip Low-Power Sub-picosecond Jitter-Measurement circuit for Low-Jitter clock generator저잡음 클럭 발생기를 위한 온칩 저전력 피코초 이하 지터 측정 회로

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To achieve low jitter in phase-locked loop (PLL), many techniques to fix loop characteristics over frequency range were introduced, but could not achieve lowest jitter over whole range because of design margins to be robust against process variations, non-linearity of PLL components, etc. Jitter-minimizing scheme with jitter-measurement can achieve minimum jitter with given conditions, but has not been popularly used because of limitation of jitter-measurement circuit. This thesis proposes an on-chip sub-picosecond jitter-measurement circuit with RC-delay lines. It can achieve sub-picosecond resolution (0.88ps ~ 8.8ps) consuming 1.7-mW, and its area is 0.027 mm2. Its non-ideal effects are analyzed, and some techniques are presented and implemented to solve those non-ideal effects.
Advisors
Cho, Seong-Hwanresearcher조성환researcher
Description
한국과학기술원 : 전기및전자공학전공,
Publisher
한국과학기술원
Issue Date
2006
Identifier
260068/325007  / 020043995
Language
eng
Description

학위논문(석사) - 한국과학기술원 : 전기및전자공학전공, 2006.8, [ vi, 107 p. ]

Keywords

TDC; jitter measurement; clock generator; 클럭 발생기; 지터 측정; PLL

URI
http://hdl.handle.net/10203/38414
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=260068&flag=dissertation
Appears in Collection
EE-Theses_Master(석사논문)
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