On-chip Low-Power Sub-picosecond Jitter-Measurement circuit for Low-Jitter clock generator저잡음 클럭 발생기를 위한 온칩 저전력 피코초 이하 지터 측정 회로

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dc.contributor.advisorCho, Seong-Hwan-
dc.contributor.advisor조성환-
dc.contributor.authorHa, Soh-Myung-
dc.contributor.author하소명-
dc.date.accessioned2011-12-14T02:03:17Z-
dc.date.available2011-12-14T02:03:17Z-
dc.date.issued2006-
dc.identifier.urihttp://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=260068&flag=dissertation-
dc.identifier.urihttp://hdl.handle.net/10203/38414-
dc.description학위논문(석사) - 한국과학기술원 : 전기및전자공학전공, 2006.8, [ vi, 107 p. ]-
dc.description.abstractTo achieve low jitter in phase-locked loop (PLL), many techniques to fix loop characteristics over frequency range were introduced, but could not achieve lowest jitter over whole range because of design margins to be robust against process variations, non-linearity of PLL components, etc. Jitter-minimizing scheme with jitter-measurement can achieve minimum jitter with given conditions, but has not been popularly used because of limitation of jitter-measurement circuit. This thesis proposes an on-chip sub-picosecond jitter-measurement circuit with RC-delay lines. It can achieve sub-picosecond resolution (0.88ps ~ 8.8ps) consuming 1.7-mW, and its area is 0.027 mm2. Its non-ideal effects are analyzed, and some techniques are presented and implemented to solve those non-ideal effects.eng
dc.languageeng-
dc.publisher한국과학기술원-
dc.subjectTDC-
dc.subjectjitter measurement-
dc.subjectclock generator-
dc.subject클럭 발생기-
dc.subject지터 측정-
dc.subjectPLL-
dc.titleOn-chip Low-Power Sub-picosecond Jitter-Measurement circuit for Low-Jitter clock generator-
dc.title.alternative저잡음 클럭 발생기를 위한 온칩 저전력 피코초 이하 지터 측정 회로-
dc.typeThesis(Master)-
dc.identifier.CNRN260068/325007 -
dc.description.department한국과학기술원 : 전기및전자공학전공, -
dc.identifier.uid020043995-
dc.contributor.localauthorCho, Seong-Hwan-
dc.contributor.localauthor조성환-
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EE-Theses_Master(석사논문)
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