Development of a Collective Thomson Scattering diagnostic system on SNU X-pinch device

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The Collective Thomson Scattering (CTS) diagnostic system has been developed for the X-pinch device at Seoul National University. The system is designed to measure various parameters of plasma jets, including plasma temperature and plasma flow velocity. For the flow velocity measurement, the second harmonic Nd:YAG laser and the collection optics are oriented in order to ensure the scattering vector is aligned with the flow direction. The collection optics have been optimized to maximize photon efficiency. Due to the requirement of high spectral dispersion and resolution for the diagnosis of CTS spectra, the spectrometer is designed with a dispersion of 0.004 nm/pixel. The spectral dispersion and resolution of the system has been measured. The CTS diagnostic system will contribute to a deeper understanding of X-pinch plasma dynamics and the development of advanced High Energy Density Plasma (HEDP)-based technologies.
Publisher
IOP Publishing Ltd
Issue Date
2023-12
Language
English
Article Type
Article
Citation

JOURNAL OF INSTRUMENTATION, v.18, no.12

ISSN
1748-0221
DOI
10.1088/1748-0221/18/12/C12004
URI
http://hdl.handle.net/10203/317867
Appears in Collection
NE-Journal Papers(저널논문)
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