Development of a Collective Thomson Scattering diagnostic system on SNU X-pinch device

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 200
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorLee, Jongminko
dc.contributor.authorKim, Jung-Hwako
dc.contributor.authorPark, Sungbinko
dc.contributor.authorYou, Yong Sungko
dc.contributor.authorLee, Jae-seokko
dc.contributor.authorGhim, Young-chulko
dc.contributor.authorHwang, Y. S.ko
dc.date.accessioned2024-01-16T08:00:34Z-
dc.date.available2024-01-16T08:00:34Z-
dc.date.created2024-01-16-
dc.date.issued2023-12-
dc.identifier.citationJOURNAL OF INSTRUMENTATION, v.18, no.12-
dc.identifier.issn1748-0221-
dc.identifier.urihttp://hdl.handle.net/10203/317867-
dc.description.abstractThe Collective Thomson Scattering (CTS) diagnostic system has been developed for the X-pinch device at Seoul National University. The system is designed to measure various parameters of plasma jets, including plasma temperature and plasma flow velocity. For the flow velocity measurement, the second harmonic Nd:YAG laser and the collection optics are oriented in order to ensure the scattering vector is aligned with the flow direction. The collection optics have been optimized to maximize photon efficiency. Due to the requirement of high spectral dispersion and resolution for the diagnosis of CTS spectra, the spectrometer is designed with a dispersion of 0.004 nm/pixel. The spectral dispersion and resolution of the system has been measured. The CTS diagnostic system will contribute to a deeper understanding of X-pinch plasma dynamics and the development of advanced High Energy Density Plasma (HEDP)-based technologies.-
dc.languageEnglish-
dc.publisherIOP Publishing Ltd-
dc.titleDevelopment of a Collective Thomson Scattering diagnostic system on SNU X-pinch device-
dc.typeArticle-
dc.identifier.wosid001132788100010-
dc.identifier.scopusid2-s2.0-85180012214-
dc.type.rimsART-
dc.citation.volume18-
dc.citation.issue12-
dc.citation.publicationnameJOURNAL OF INSTRUMENTATION-
dc.identifier.doi10.1088/1748-0221/18/12/C12004-
dc.contributor.localauthorGhim, Young-chul-
dc.contributor.nonIdAuthorLee, Jongmin-
dc.contributor.nonIdAuthorKim, Jung-Hwa-
dc.contributor.nonIdAuthorPark, Sungbin-
dc.contributor.nonIdAuthorHwang, Y. S.-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorPlasma diagnostics-interferometry-
dc.subject.keywordAuthorspectroscopy and imaging-
dc.subject.keywordAuthorPlasma diagnostics probes-
Appears in Collection
NE-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0