Enhancing Mechanical Reliability in Thin Film Encapsulation Using Low-Temperature Atomic Layer Deposition

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dc.contributor.authorOh, Seung Jinko
dc.contributor.authorLee, Sun-Wooko
dc.contributor.authorHam, Yeong Seokko
dc.contributor.authorKwon, Jeong Hyunko
dc.contributor.authorKim, Taek-Sooko
dc.date.accessioned2024-01-05T03:00:19Z-
dc.date.available2024-01-05T03:00:19Z-
dc.date.created2024-01-02-
dc.date.issued2023-11-08-
dc.identifier.citationThe 14th International Symposium on NDT in Aerospace (AeroNDT2023)-
dc.identifier.urihttp://hdl.handle.net/10203/317428-
dc.languageEnglish-
dc.publisherThe Korean Society of Mechanical Engineers-
dc.titleEnhancing Mechanical Reliability in Thin Film Encapsulation Using Low-Temperature Atomic Layer Deposition-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameThe 14th International Symposium on NDT in Aerospace (AeroNDT2023)-
dc.identifier.conferencecountryKO-
dc.identifier.conferencelocationThe Westin Chosun Busan-
dc.contributor.localauthorKim, Taek-Soo-
dc.contributor.nonIdAuthorHam, Yeong Seok-
dc.contributor.nonIdAuthorKwon, Jeong Hyun-
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ME-Conference Papers(학술회의논문)
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