Microscopic bit-level wear-leveling for NAND flash memory

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By microscopically observing widely used data files, we identified the considerable room for life time improvement in NAND flash memory, which is due to the discovery of a non-uniformity in bit-level data patterns. In an attempt to exploit the discovery, we propose a novel bit-level wear-leveling scheme. Instead of considering only the view of page-level or block-level, we incorporate the non-uniformity in data encoding patterns into wear-leveling scheme. Because of its orthogonality to the existing block-level wear-leveling approaches, our solution can be adopted over the existing solutions without considerable overhead and extend NAND flash's life span up to 36% in case of SLC.
Publisher
Springer Verlag
Issue Date
2013-09
Language
English
Citation

4th International Conference on Mobile, Ubiquitous, and Intelligent Computing, MUSIC 2013, pp.315 - 320

DOI
10.1007/978-3-642-40675-1_48
URI
http://hdl.handle.net/10203/314691
Appears in Collection
EE-Conference Papers(학술회의논문)
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