Multi-scale dimensional metrology with a frequency comb: From sub-nanometers to kilometers
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Young-Jin | ko |
| dc.contributor.author | Anh, Nguyen Duy | ko |
| dc.contributor.author | Kim, Seung-Woo | ko |
| dc.date.accessioned | 2023-07-05T01:00:47Z | - |
| dc.date.available | 2023-07-05T01:00:47Z | - |
| dc.date.created | 2023-06-08 | - |
| dc.date.issued | 2020-09 | - |
| dc.identifier.citation | LS 2020 - Part of Frontiers in Optics + Laser Science APS/DLS 2020 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/310299 | - |
| dc.description.abstract | This presentation will introduce how we have utilized a frequency comb for multi-scale high-precision dimensional measurements, ranging from sub-nanometer-scale thermo-plasmonic motions to kilometer-scale inter-satellite-distances. | - |
| dc.language | English | - |
| dc.publisher | The Optical Society | - |
| dc.title | Multi-scale dimensional metrology with a frequency comb: From sub-nanometers to kilometers | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-85118765244 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | LS 2020 - Part of Frontiers in Optics + Laser Science APS/DLS 2020 | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Virtual | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
| dc.contributor.nonIdAuthor | Kim, Young-Jin | - |
| dc.contributor.nonIdAuthor | Anh, Nguyen Duy | - |
- Appears in Collection
- ME-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.