DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Joon Pyo | ko |
dc.contributor.author | Sim, Jaeho | ko |
dc.contributor.author | Bidenko, Pavlo | ko |
dc.contributor.author | Geum, Dae-Myeong | ko |
dc.contributor.author | Kim, Seong Kwang | ko |
dc.contributor.author | Shim, Joonsup | ko |
dc.contributor.author | Kim, Jongmin | ko |
dc.contributor.author | Kim, Sanghyeon | ko |
dc.date.accessioned | 2022-11-14T06:01:23Z | - |
dc.date.available | 2022-11-14T06:01:23Z | - |
dc.date.created | 2022-11-14 | - |
dc.date.created | 2022-11-14 | - |
dc.date.created | 2022-11-14 | - |
dc.date.issued | 2022-11 | - |
dc.identifier.citation | IEEE ELECTRON DEVICE LETTERS, v.43, no.11, pp.1834 - 1837 | - |
dc.identifier.issn | 0741-3106 | - |
dc.identifier.uri | http://hdl.handle.net/10203/299571 | - |
dc.description.abstract | In this work, we demonstrated capacitor-less 4F(2) 2-terminal InGaAs npn junction DRAM through careful device design. Using epitaxially grown InGaAs which have a steep junction, fabricated InGaAs bistable resistor (biristor) DRAM showed low voltage operation (similar to 2 V), fast switching speed (<:20 ns), long-term retention (10(3) s at 85 degrees C), and high endurance (>10(10) cycles) with a high sensing margin. Considering this feasibility study, we believe that InGaAs n(+)pn(+) junction DRAM could be a good technological option for future scalable 3D DRAM. | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Capacitor-Less 4F(2) DRAM Using Vertical InGaAs Junction for Ultimate Cell Scalability | - |
dc.type | Article | - |
dc.identifier.wosid | 000876041700014 | - |
dc.identifier.scopusid | 2-s2.0-85137915242 | - |
dc.type.rims | ART | - |
dc.citation.volume | 43 | - |
dc.citation.issue | 11 | - |
dc.citation.beginningpage | 1834 | - |
dc.citation.endingpage | 1837 | - |
dc.citation.publicationname | IEEE ELECTRON DEVICE LETTERS | - |
dc.identifier.doi | 10.1109/LED.2022.3204436 | - |
dc.contributor.localauthor | Kim, Sanghyeon | - |
dc.contributor.nonIdAuthor | Sim, Jaeho | - |
dc.contributor.nonIdAuthor | Bidenko, Pavlo | - |
dc.contributor.nonIdAuthor | Geum, Dae-Myeong | - |
dc.contributor.nonIdAuthor | Kim, Jongmin | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | DRAM | - |
dc.subject.keywordAuthor | epitaxial growth | - |
dc.subject.keywordAuthor | impact ionization | - |
dc.subject.keywordAuthor | InGaAs biristor | - |
dc.subject.keywordAuthor | npn junction | - |
dc.subject.keywordPlus | BIRISTOR | - |
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