Removal of back-reflection noise at ultrathin imaging probes by the single-core illumination and wide-field detection
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Yoon, Changhyeong | ko |
| dc.contributor.author | Kang, Munkyu | ko |
| dc.contributor.author | Hong, Jin Hee | ko |
| dc.contributor.author | Yang, Taeseok | ko |
| dc.contributor.author | Xing, Jing Chao | ko |
| dc.contributor.author | Yoo, Hongki | ko |
| dc.contributor.author | Choi, Youngwoon | ko |
| dc.contributor.author | Choi, Wonshik | ko |
| dc.date.accessioned | 2020-03-19T03:31:35Z | - |
| dc.date.available | 2020-03-19T03:31:35Z | - |
| dc.date.created | 2019-12-31 | - |
| dc.date.issued | 2018-01-29 | - |
| dc.identifier.citation | SPIE Photonics West 2018 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/272908 | - |
| dc.language | English | - |
| dc.publisher | SPIE | - |
| dc.title | Removal of back-reflection noise at ultrathin imaging probes by the single-core illumination and wide-field detection | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | SPIE Photonics West 2018 | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | The Moscone Center, San Francisco, CA | - |
| dc.contributor.localauthor | Yoo, Hongki | - |
| dc.contributor.nonIdAuthor | Yoon, Changhyeong | - |
| dc.contributor.nonIdAuthor | Kang, Munkyu | - |
| dc.contributor.nonIdAuthor | Hong, Jin Hee | - |
| dc.contributor.nonIdAuthor | Yang, Taeseok | - |
| dc.contributor.nonIdAuthor | Xing, Jing Chao | - |
| dc.contributor.nonIdAuthor | Choi, Youngwoon | - |
| dc.contributor.nonIdAuthor | Choi, Wonshik | - |
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