DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Inhwa | ko |
dc.contributor.author | Kim, Sanghyeok | ko |
dc.contributor.author | Yun, J. | ko |
dc.contributor.author | Park, Inkyu | ko |
dc.contributor.author | Kim, Taek-Soo | ko |
dc.date.accessioned | 2019-04-16T00:50:31Z | - |
dc.date.available | 2019-04-16T00:50:31Z | - |
dc.date.created | 2014-01-14 | - |
dc.date.issued | 2012-10-07 | - |
dc.identifier.citation | The Electrochemical Society Meeting | - |
dc.identifier.uri | http://hdl.handle.net/10203/259434 | - |
dc.language | English | - |
dc.publisher | ECS | - |
dc.title | Annealing-induced interfacial fracture energy of silver nanoparticle films on substrate for reliable printed electronics | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | The Electrochemical Society Meeting | - |
dc.identifier.conferencecountry | US | - |
dc.contributor.localauthor | Park, Inkyu | - |
dc.contributor.localauthor | Kim, Taek-Soo | - |
dc.contributor.nonIdAuthor | Lee, Inhwa | - |
dc.contributor.nonIdAuthor | Kim, Sanghyeok | - |
dc.contributor.nonIdAuthor | Yun, J. | - |
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