Direct Measurement and Enhancement of Adhesion Energy of Bi-Te Thermoelectric Thin Films

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dc.contributor.authorKim, C.ko
dc.contributor.authorJeon, S.ko
dc.contributor.authorLee, H.ko
dc.contributor.authorHyun, S.ko
dc.contributor.authorKim, Taek-Sooko
dc.date.accessioned2019-04-16T00:50:28Z-
dc.date.available2019-04-16T00:50:28Z-
dc.date.created2014-01-14-
dc.date.issued2012-10-07-
dc.identifier.citationThe Electrochemical Society Meeting-
dc.identifier.urihttp://hdl.handle.net/10203/259433-
dc.languageEnglish-
dc.publisherECS-
dc.titleDirect Measurement and Enhancement of Adhesion Energy of Bi-Te Thermoelectric Thin Films-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameThe Electrochemical Society Meeting-
dc.identifier.conferencecountryUS-
dc.contributor.localauthorKim, Taek-Soo-
dc.contributor.nonIdAuthorKim, C.-
dc.contributor.nonIdAuthorJeon, S.-
dc.contributor.nonIdAuthorLee, H.-
dc.contributor.nonIdAuthorHyun, S.-
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ME-Conference Papers(학술회의논문)
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