DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, C. | ko |
dc.contributor.author | Jeon, S. | ko |
dc.contributor.author | Lee, H. | ko |
dc.contributor.author | Hyun, S. | ko |
dc.contributor.author | Kim, Taek-Soo | ko |
dc.date.accessioned | 2019-04-16T00:50:28Z | - |
dc.date.available | 2019-04-16T00:50:28Z | - |
dc.date.created | 2014-01-14 | - |
dc.date.issued | 2012-10-07 | - |
dc.identifier.citation | The Electrochemical Society Meeting | - |
dc.identifier.uri | http://hdl.handle.net/10203/259433 | - |
dc.language | English | - |
dc.publisher | ECS | - |
dc.title | Direct Measurement and Enhancement of Adhesion Energy of Bi-Te Thermoelectric Thin Films | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | The Electrochemical Society Meeting | - |
dc.identifier.conferencecountry | US | - |
dc.contributor.localauthor | Kim, Taek-Soo | - |
dc.contributor.nonIdAuthor | Kim, C. | - |
dc.contributor.nonIdAuthor | Jeon, S. | - |
dc.contributor.nonIdAuthor | Lee, H. | - |
dc.contributor.nonIdAuthor | Hyun, S. | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.