DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김택수 | ko |
dc.date.accessioned | 2019-04-16T00:32:26Z | - |
dc.date.available | 2019-04-16T00:32:26Z | - |
dc.date.created | 2014-01-14 | - |
dc.date.issued | 2012-10-16 | - |
dc.identifier.citation | KU-ETHZ International Micro SOFC Workshop | - |
dc.identifier.uri | http://hdl.handle.net/10203/259400 | - |
dc.language | English | - |
dc.publisher | KU-ETHZ | - |
dc.title | Mechanical Reliability of Advanced Thin Films | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | KU-ETHZ International Micro SOFC Workshop | - |
dc.identifier.conferencecountry | KO | - |
dc.contributor.localauthor | 김택수 | - |
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