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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Conference Papers(학술회의논문)

Dual detection confocal fluorescence microscopy: depth imaging

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Dong-Ryoung Lee / Young-Duk Kim / Hyoung-Jun Jeong / Jong-Min Lee / Gweon, Dae-Gabresearcher / Hong-ki Yoo
Publisher
SPIE
Issue Date
2013-02-06
Language
English
Citation

SPIE Photonics West 2013

URI
http://hdl.handle.net/10203/259044
Appears in Collection
ME-Conference Papers(학술회의논문)
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