Performance Comparison of Wet-Etched and Dry-Etched Geiger-mode Avalanche Photodiodes Using a Single Diffusion Process

Cited 4 time in webofscience Cited 2 time in scopus
  • Hit : 153
  • Download : 391
Publisher
International Symposium on Compound Semiconductors
Issue Date
2013-05-23
Language
English
Citation

40th International Symposium on Compound Semiconductors

DOI
10.1002/pssc.201300178
URI
http://hdl.handle.net/10203/258412
Appears in Collection
EE-Conference Papers(학술회의논문)
Files in This Item
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 4 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0