Performance Comparison of Wet-Etched and Dry-Etched Geiger-mode Avalanche Photodiodes Using a Single Diffusion Process

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dc.contributor.authorLee, Ki Wonko
dc.contributor.authorYang, Kyounghoonko
dc.date.accessioned2019-04-15T21:13:00Z-
dc.date.available2019-04-15T21:13:00Z-
dc.date.created2013-06-25-
dc.date.created2013-06-25-
dc.date.issued2013-05-23-
dc.identifier.citation40th International Symposium on Compound Semiconductors-
dc.identifier.urihttp://hdl.handle.net/10203/258412-
dc.languageEnglish-
dc.publisherInternational Symposium on Compound Semiconductors-
dc.titlePerformance Comparison of Wet-Etched and Dry-Etched Geiger-mode Avalanche Photodiodes Using a Single Diffusion Process-
dc.typeConference-
dc.identifier.wosid000334583400024-
dc.type.rimsCONF-
dc.citation.publicationname40th International Symposium on Compound Semiconductors-
dc.identifier.conferencecountryJA-
dc.identifier.conferencelocationkobe-
dc.identifier.doi10.1002/pssc.201300178-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorYang, Kyounghoon-
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