DSpace at KOASAS: Characterization of Ultra-Thin Dielectric Using Time Domain Reflectometry

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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Characterization of Ultra-Thin Dielectric Using Time Domain Reflectometry

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Yonghun Kim / Seung-heon Baek / Changhoon Jeon / Young Gon Lee / JinJu Kim / Ukjin Jung / Lee, Seok-Hee researcher / Byoung Hun Lee

Publisher: The Japan Society of Applied Physics

Issue Date: 2013-11-08

Language: English

Citation: International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (IWDTF), pp.113 - 114

URI: http://hdl.handle.net/10203/256397

Appears in Collection: EE-Conference Papers(학술회의논문)

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