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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Characterization of Ultra-Thin Dielectric Using Time Domain Reflectometry

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dc.contributor.authorYonghun Kimko
dc.contributor.authorSeung-heon Baekko
dc.contributor.authorChanghoon Jeonko
dc.contributor.authorYoung Gon Leeko
dc.contributor.authorJinJu Kimko
dc.contributor.authorUkjin Jungko
dc.contributor.authorLee, Seok-Heeko
dc.contributor.authorByoung Hun Leeko
dc.date.accessioned2019-04-15T17:10:38Z-
dc.date.available2019-04-15T17:10:38Z-
dc.date.created2013-11-06-
dc.date.issued2013-11-08-
dc.identifier.citationInternational Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (IWDTF), pp.113 - 114-
dc.identifier.urihttp://hdl.handle.net/10203/256397-
dc.languageEnglish-
dc.publisherThe Japan Society of Applied Physics-
dc.titleCharacterization of Ultra-Thin Dielectric Using Time Domain Reflectometry-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage113-
dc.citation.endingpage114-
dc.citation.publicationnameInternational Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (IWDTF)-
dc.identifier.conferencecountryJA-
dc.identifier.conferencelocationUniversity of Tsukuba, Tokyo, Japan-
dc.contributor.localauthorLee, Seok-Hee-
dc.contributor.nonIdAuthorYonghun Kim-
dc.contributor.nonIdAuthorSeung-heon Baek-
dc.contributor.nonIdAuthorChanghoon Jeon-
dc.contributor.nonIdAuthorYoung Gon Lee-
dc.contributor.nonIdAuthorJinJu Kim-
dc.contributor.nonIdAuthorUkjin Jung-
dc.contributor.nonIdAuthorByoung Hun Lee-
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EE-Conference Papers(학술회의논문)
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