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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Detection of the Interface-Trap Charge Density and Lateral Nonuniformity of Through-Silicon Vias Kim, Kibeom; Ahn, Jangyong; Ahn, Seungyoung, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.28, no.5, pp.422 - 424, 2018-05 |
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