Continuous-wave laser thermography for in-line inspection of micro-cracks in flexible OLEDs
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sohn, Hoon | ko |
| dc.contributor.author | Park, Jiho | ko |
| dc.contributor.author | Hwang, Soonkyu | ko |
| dc.date.accessioned | 2018-12-20T06:10:10Z | - |
| dc.date.available | 2018-12-20T06:10:10Z | - |
| dc.date.created | 2018-12-05 | - |
| dc.date.created | 2018-12-05 | - |
| dc.date.issued | 2018-02 | - |
| dc.identifier.citation | International Institute of Engineers & Researchers | - |
| dc.identifier.uri | http://hdl.handle.net/10203/248187 | - |
| dc.language | English | - |
| dc.publisher | The Institute of Research Engineers and Scientists | - |
| dc.title | Continuous-wave laser thermography for in-line inspection of micro-cracks in flexible OLEDs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | International Institute of Engineers & Researchers | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | Ramada Plaza Hotel, Jeju Island | - |
| dc.contributor.localauthor | Sohn, Hoon | - |
| dc.contributor.nonIdAuthor | Park, Jiho | - |
| dc.contributor.nonIdAuthor | Hwang, Soonkyu | - |
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