Thermal Noise Model for Short-Channel MOSFETs

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dc.contributor.authorHan, Kwangseok-
dc.contributor.authorShin, Hyungcheol-
dc.contributor.authorLee, Kwyro-
dc.date.accessioned2011-08-09T06:34:19Z-
dc.date.available2011-08-09T06:34:19Z-
dc.date.created2012-02-06-
dc.date.issued2003-02-
dc.identifier.citationThe 10th Korean Conference on Semiconductors, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/24806-
dc.languageKOR-
dc.language.isoen_USen
dc.publisherThe 10th Korean Conference on Semiconductors-
dc.titleThermal Noise Model for Short-Channel MOSFETs-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameThe 10th Korean Conference on Semiconductors-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorShin, Hyungcheol-
dc.contributor.localauthorLee, Kwyro-
dc.contributor.nonIdAuthorHan, Kwangseok-

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