DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cho, Youngbin | ko |
dc.contributor.author | Son, Minjung | ko |
dc.contributor.author | Ko, Unghyun | ko |
dc.contributor.author | Jeong, Hyuntae | ko |
dc.contributor.author | Shin, Jennifer Hyunjong | ko |
dc.date.accessioned | 2018-07-24T01:50:14Z | - |
dc.date.available | 2018-07-24T01:50:14Z | - |
dc.date.created | 2018-06-29 | - |
dc.date.issued | 2018-06-20 | - |
dc.identifier.citation | 2018 International Symposium on Microchemistry and Microsystems | - |
dc.identifier.uri | http://hdl.handle.net/10203/243835 | - |
dc.language | English | - |
dc.publisher | International Symposium on Microchemistry and Microsystems | - |
dc.title | ELECTRIC FIELD-INDUCED PHYSICAL STRESS ALIGNMENT GUIDES ELECTROTACTIC MIGRATION WITHIN EPITHELIAL MONOLAYER | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 2018 International Symposium on Microchemistry and Microsystems | - |
dc.identifier.conferencecountry | KO | - |
dc.identifier.conferencelocation | Hanwha Resort Haeundae Tivoli | - |
dc.contributor.localauthor | Shin, Jennifer Hyunjong | - |
dc.contributor.nonIdAuthor | Cho, Youngbin | - |
dc.contributor.nonIdAuthor | Son, Minjung | - |
dc.contributor.nonIdAuthor | Ko, Unghyun | - |
dc.contributor.nonIdAuthor | Jeong, Hyuntae | - |
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