Modeling and simulation of a resistive thermal probe

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Resistive probe can detect the variation of electric field from a media by its current variation. Equivalently it is a variable resistor, which is sensitive to electric field. However, the experimental results show that another mechanism is involved in it and it is considered to have a relationship with the topography of the media. In this paper, this newly observed mechanism is explained as thermal effect with simulation results. This can affect the signal quality as a noise source or detection limitation of the field variation or, in other hand can be used as a highly localized thermal tip sensor. © 2007 IEEE.
Publisher
IEEE
Issue Date
2007-10
Language
English
Citation

6th IEEE Conference on SENSORS, IEEE SENSORS 2007, pp.320 - 324

DOI
10.1109/ICSENS.2007.4388401
URI
http://hdl.handle.net/10203/238147
Appears in Collection
MS-Conference Papers(학술회의논문)
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